| Software Packages | EELSAnalyser |
| Cold-FEG TEM alignment guide | JEOL 2010F |
| Computing Suits and Coding | MATLAB, C++, Python, R, FORTRAN |
| Experimentation | Embedded System development: Arduino, Raspberry pi, MSP430, EZ430-RF2500 |
| Collaboration Interests | Hyperspectral data Analysis, EELS Spectrum Analysis, Advanced Spatial Statistical Analysis |
| Unsupervised/Supervised machine learning, Clustering, Data Modelling, Statistical Signal Processing, | |
| Image Data Analysis, High Performance Computing, Pipeline, Multi-core processing, Data Compression. |
| Jan 2014 | PhD Scholarship: Dept of EEE, The University of Sheffield, UK 01/2014 - 01/2017 |
| Sep 2012 | Indian Merit Postgraduate Scholarship, UK 09/2012 - 09/2013 |
| May 2017 | IOP Research Student Conference Fund, MSM-XX 2017, 05/2017 |
| Apr 2017 | RMS Travel Bursary: Conference Travel Grant, MSM-XX 2017, 04/2017 |
| Aug 2016 | IoP CR Barber Trust Fund: Conference Travel Grant, EMC2016,08/2016 |
| Aug 2016 | Learned Society Fund: Conference Travel Grant, EMC2016, 08/2016 |
| Apr 2016 | Learned Society Fund: Conference Travel Grant, EMAG2016, 04/2016 |
| May 2015 | RMS Travel Bursary: Conference Travel Grant, MMC2015, 07/2015 |
| Dec 2014 | Learned Society Fund: Conference Travel Grant, MSM-XIX 2015, 03/2015 |
| IEEE | 2018– |
| IETE | 2008-2012 |
| Institute of Physics (IoP) | 2014-2018 |
| Royal Microscopical Society (RMS) | 2014-2018 |
| European Microscopy Society (EMS) | 2014-2018 |
V. C. Angadi, A. Mousavi, D. Bartolome, M. Tellarini and M. Fazziani (2020), "Regressive Event-Tracker: A Causal Prediction Modelling of Degradation in High Speed Manufacturing", In 30th International Conference on Flexible Automation and Intelligent Manufacturing, Athens, Greece.
V. C. Angadi, A. Mousavi, D. Bartolome, M. Tellarini, M. Fazziani (2020), "Causal Modelling for Predicting Machine Tools Degradation in High Speed Production Process", In 4th IFAC Workshop on Advanced Maintenance Engineering, Services and Technologies, Cambridge, UK.
M. Danishvar, V. C. Angadi and A. Mousavi (2020), "A PdM framework Through the Event-based Genomics of Machine Breakdown", In The 9th Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modelling, pp. 1-6, Vancouver, Canada.
A. Werner, V. C. Angadi, J. Lentes and A. Mousavi (2020), "Predictive Maintenance – When the Digital Shadow reaches limitations", ZWF Zeitschrift für wirtschaftlichen Fabrikbetrieb, 115(5), pp. 335-339.
Z. Huang, V. C. Angadi, M. Danishvar, A. Mousavi and M. Li (2018), "Zero Defect Manufacturing of Microsemiconductors – An Application of Machine Learning and Artificial Intelligence", In 2018 5th International Conference on Systems and Informatics (ICSAI), Nanjing, pp. 449-454.
V. C. Angadi (2018), "Quantitative Electron Energy-loss Spectrum Data Processing for Hyperspectral Imaging in Analytical Transmission Electron Microscopy", Doctoral Thesis, University of Sheffield, UK.
V. C. Angadi, F. Benz, I. Tischer, K. Thonke, T. Aoki and T. Walther (2017), "Evidence of terbium and oxygen co-segregation in annealed AlN: Tb" Applied Physics Letters, 110(22), pp. 222102.
V. C. Angadi, C. Abhayaratne and T. Walther (2017), "Determination of bandgap onset by blind deconvolution of electron energy-loss spectra (EELS): 1D EELS vs 2D EEL spectrum images", In 2017 20th Microscopy of Semiconducting Materials, Oxford, UK.
T. Walther, X. Wang, V. C. Angadi, P. Ruterana, P. Longo and T. Aoki (2017), "Study of phase separation in an InGaN alloy by electron energy loss spectroscopy in an aberration corrected monochromated scanning transmission electron microscope", Journal of Material Research, 32(5), pp. 983-995.
V. C. Angadi and T. Walther (2016), "Influence of background subtraction and deconvolution on calculation of EELS core‐loss intensities", In European Microscopy Congress 2016: Proceesings, Lyon, France.
V. C. Angadi and T. Walther (2016), "Systematic study of background subtraction techniques for EELS", In 2016 Electron Microscopy and Analysis Group Conference, Durham, UK.
V. C. Angadi, C. Abhayaratne and T. Walther (2016), "Automated background subtraction technique for electron energy‐loss spectroscopy and application to semiconductor heterostructures" Journal of Microscopy, 262(2), pp. 157-166.
V. C. Angadi, C. Abhayaratne and T. Walther (2015), "Development of automated background subtraction technique for electron energy-loss spectroscopy", In 2015 Electron Microscopy and Analysis Group Conference, Manchester, UK.
V. C. Angadi, T. Walther and C. Abhayaratne (2015), "Automated background subtraction for electron energy-loss spectroscopy and application to spectral imaging of semiconductor layers", In 2015 19th Microscopy of Semiconducting Materials, Cambridge, UK.
V. C. Angadi and T. Walther (2014), "Core-Loss Edge Detection and Background Subtraction Techniques for EELS", In 2014 Hyperspectral Imaging and Applications Conferenc, Coventry, UK.
V. C. Angadi (2013), "Quality of Experience based Video Summarization", MSc Dissertation, University of Sheffield, UK.
V. C. Angadi, P. K. Kulkarni and P. S. Somasagar (2012), "Design and development of secured image watermarking for embedded system applications", BEng Dissertation, VTU, India.
M. M. Dixit, P. K. Kulkarni, P. S. Somasagar and V. C. Angadi (2012), "Variable scaling factor based invisible image watermarking using hybrid DWT - SVD compression - decompression technique", In 2012 IEEE Students’ Conference on Electrical, Electronics and Computer Science, Bhopal, India, pp. 1-4.
M. M. Dixit, P. K. Kulkarni, P. S. Somasagar and V. C. Angadi (2011), "Computational Analysis of Variable Scaling Factor based Invisible Image Watermarking using Hybrid SVD - DCT Compression - Decompression Technique", In 2011 IEEE International Conference on Computational Intelligence and Computing Research (ICCIC), Levengipuram - Kanyakumari, India.